Electron Microscope Accessories
Electron Microscopy Sciences Micro-Tool Micro-Graver, 0.25 mm, Tip 13
These tools are designed for anyone who is engaged in microscope work, miniature applications as well as specimen manipulation. Micro-Tools are the smallest known precision tools available for the laboratory and micro electronics industry. Micro-Tool consists of a threaded handle (MT1), and an interchangeable threaded base with tool tip. Tip material is hardened tool steel unless otherwise noted.
Size: 0.25 mm
Tips: Tip 13
Electron Microscopy Sciences Micro-Tool Micro-Scale, 0.50 mm, Tip 23
These tools are designed for anyone who is engaged in microscope work, miniature applications as well as specimen manipulation. Micro-Tools are the smallest known precision tools available for the laboratory and micro electronics industry. Micro-Tool consists of a threaded handle (MT1), and an interchangeable threaded base with tool tip. Tip material is hardened tool steel unless otherwise noted.
Size: 0.50 mm
Tips: Tip 23
Electron Microscopy Sciences Micro-Tool Micro-Carbide Scriber, 0.25 mm, Tip 28
These tools are designed for anyone who is engaged in microscope work, miniature applications as well as specimen manipulation. Micro-Tools are the smallest known precision tools available for the laboratory and micro electronics industry. Micro-Tool consists of a threaded handle (MT1), and an interchangeable threaded base with tool tip. Tip material is hardened tool steel unless otherwise noted.
Size: 0.25 mm
Tips: Tip 28
Electron Microscopy Sciences Micro-Tool Micro-Graver, 0.12 mm, Tip 13
These tools are designed for anyone who is engaged in microscope work, miniature applications as well as specimen manipulation. Micro-Tools are the smallest known precision tools available for the laboratory and micro electronics industry. Micro-Tool consists of a threaded handle (MT1), and an interchangeable threaded base with tool tip. Tip material is hardened tool steel unless otherwise noted.
Size: 0.12 mm
Tips: Tip 13
Electron Microscopy Sciences SEM Hitachi S-450 M4 Mount 3-Division 5/8", 1/4" height, Aluminum
Hitachi S-450 SEM mounts with M4 tapered hole and female thread. With 3 divisions. Made from ultra-pure aluminum with standard lathe finish.
Head: 5/8"
Height: 1/4"
Electron Microscopy Sciences Multi Pin Holder 45 degree for 3 pin stubs
This 25.4 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to three standard 12.7 mm (1/2") pin stubs with 3.2 mm (1/8") pin.
Electron Microscopy Sciences Metallurgical Mount Holder 2" and 50 mm, 3.2 mm x 8mm Pin
This mount holder which is made from machined aluminum with stainless steel Allen screws. Designed specifically for 2" and 50 mm metallurgical mounts.
Type: 3.2 mm x 8 mm Pin
Electron Microscopy Sciences Geological Thin Section Holder Hitachi M4
This thin section holder is made from aluminum with copper clips and brass screws. The unit measures 55x30x8 mm and holds a standard geological thin section or slide measuring 47 x 27 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Electron Microscopy Sciences Calibration Specimen 700-1D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges Pitch 700, W-coated Photoresist on Si. Use contact or TappingMode.
Mount: AFM
Electron Microscopy Sciences Calibration Specimen 300-1D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges. Pitch 288 W-coated Photoresist on Si Use contact or Tapping Mode.
Mount: AFM